Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical specificity with high-resolution imaging.
Abstract: In order to achieve automatic detection of car paint defects, this study proposes an algorithm based on phase measuring deflectometry (PMD) with multisource image fusion. First, a dataset ...
Abstract: For product reliability and workplace safety, flaw detection in steel castings is very important. The study presents a novel deep learning approach that can employ X-ray images to detect ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback