Wolfspeed: The Silicon Carbide Opportunity Is Real, The Economics Are Not There Yet

Wolfspeed holds a key SiC position with OEM ties and IP, priced at ~8x sales as a 200mm ramp, utilization, and margins remain ...
Semiconductor Engineering

Wafer Probe Struggles To Adapt To Multi-Die Assemblies

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
IEEE

Evaluating the ANN Model Performance for PID Controller Tuning in Flow Process Control: A Comparative Study

Abstract: Accurate controller tuning is important for ensuring optimal performance in flow control processes, particularly onboard ships, where precise control of fluid systems such as oil, gas, and ...
IEEE

Meta-Optimized LDMOS Process–Device Co-Optimization: Extrapolation-Enhanced Modeling With Wafer-Level Validation

Abstract: Accurate and efficient modeling of lateral double-diffused MOS (LDMOS) devices is critical for process optimization and reliability analysis, especially under limited simulation budgets.