Abstract: Metal gate height (MGH) control is a critical mission in 7nm FinFET process. Gate lateral resistance, usually measured on a four-terminal test structure, is a convenient indicator of gate ...
New York Post may be compensated and/or receive an affiliate commission if you click or buy through our links. Featured pricing is subject to change. What does it truly mean to master something? In ...
Abstract: In this paper, a layout optimization of GSG-pad structures for mm-wave devices testing is studied. We find that the parasitic of GSG-pad is strongly related to the area and shape of the pad ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results