Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical specificity with high-resolution imaging.

Abstract: Identifying wheelset tread defects for heavy-haul trains is an increasingly valued yet challenging task. These defects are usually characterized by irregular shapes, wide coverage, and high ...

Maine Democratic Senate candidate Graham Platner covered up a tattoo on his chest that resembled a Nazi symbol, a spokesperson for Platner’s campaign confirmed to NBC News. The move comes just days ...

Republican Rep. Dave Taylor condemned a "vile" symbol at his Washington, D.C. office. Taylor's office called the symbol vandalism. An American flag with a swastika was seen at the desk of one of ...

The suspected shooter left a hodgepodge of extremely online taunts. The suspected shooter left a hodgepodge of extremely online taunts. Tyler Robinson, apprehended last night in connection to the ...

ABSTRACT: Regular pipeline inspections are crucial for timely identification of critical defects and ensuring pipeline integrity. To address the challenges of detecting defects in PE gas pipelines ...

Pima County Sheriff's Department has identified the man whose remains were discovered in late 2024 as 55-year-old Ronald Woolf. In a press conference held Friday, Sheriff Chris Nanos said Woolf's ...

ABSTRACT: This paper reviews fault identification and predictive maintenance techniques essential for the reliable operation of high-voltage power systems. The increasing integration of renewable ...

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...