Electronic Design

Design-For-Test Links Design And Manufacturing

This is accomplished by connecting all of the design's registers in serial fashion, allowing test engineers to shift data in and out through a few ports at the chip level (Fig. 1). That allows, for ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Hyperconvergence Of Design For Test And Physical Design

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
Semiconductor Engineering

Preparing For Test Early In The Design Flow

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...
EDN

Design for test and design for safety—software architectures made to measure

Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...
EDN

Cadence garners IBM design-for-test capabilities

Cadence Design Systems (San Jose, CA; www.cadence.com) and IBM (East Fishkill, NY; www.ibm.com) have announced a series of agreements intended to simplify the chip-design process while helping ...