This is accomplished by connecting all of the design's registers in serial fashion, allowing test engineers to shift data in and out through a few ports at the chip level (Fig. 1). That allows, for ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Siemens plans to integrate Aster's advanced "shift-left" design for test functionality into Siemens' Xpedition and Valor ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...
Connected devices and systems have become an integral part of our everyday life and we take this for granted. Finding the fastest way to our destination with a smartphone, reading the news on a tablet ...
Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...
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