REDMOND, Wash. – May 18, 2020 — Radiant Vision Systems, a leading provider of test and measurement solutions for illuminated components and displays, announces a new software extension for its ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Active Learning to Reduce Data Requirements For Defect Identification in Semiconductor Manufacturing
A new technical paper titled “Exploring Active Learning for Semiconductor Defect Segmentation” was published by researchers at Agency for Science, Technology and Research (A*STAR) in Singapore. “We ...
Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural network (CNN) with ...
Radiant Vision Systems, a leading provider of test and measurement solutions for illuminated components and displays, announces a new software extension for its TrueTest™ Automated Visual Inspection ...
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