Frenchtown, N.J. — Aries Electronics has introduced a new center probe RF test socket designed specifically for use with Delta handlers. The new test sockets incorporate built-in, replaceable, ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Ironwood Electronics, an expert in developing high-speed interfaces for processors, peripheral IC's and memory devices and a development partner with both Agilent and Tektronix, has announced the ...

Contact resistance, or CRES, is one of those problems that most engineers prefer not to think about until it’s staring them in the face. For years, it could be managed quietly with routine probe card ...

The Burn-in and Test Strategies Workshop 2016 took place March 6-9 in Mesa, AZ. It commenced with a tutorial on adaptive test, outlier analysis, and burn-in reduction/elimination and continued ...