Kelvin probe force microscopy (abbreviated as KPFM, KFM or SKFM) is a technique predicated on atomic force microscopy (AFM): used to examine the electronic properties of nanoscale materials and ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...

A new study offers a nanoscopic view of complex oxides, which have great potential for advanced microelectronics. Analysis from a team led by Argonne researchers reveals never-before-seen details ...

Organic photovoltaic cells promise cheaper solar power, but researchers still need to work out how to improve their efficiency. Scientists at the University of Washington, US, have demonstrated a ...

(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...