In-situ photoluminescence (shown as red) at the end of every round of quantum vacancy defect implantation (defects shown as black circles) offers useful, real-time feedback for the defect ...
Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Schematic diagram of the method for directly visualizing defects in 2D semiconductors. (Courtesy: G Zhang) Directly visualizing structural defects in semiconductors on large scales is no easy task.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback