In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...
Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...
An interview with Prof. David Alsteens, Université Catholique de Louvain conducted by April Cashin-Garbutt, MA (Cantab). Can you please give a brief introduction to your research using AFM to image ...
Bruker’s PeakForce Tapping is an exclusive operating mode in atomic force microscope (AFM) technology following the launch of TappingMode. This mode provides high resolution imaging, measuring samples ...
insights from industryDr. Thomas MuellerDirector of Product ManagementBruker Nano Surfaces An interview with Dr. Thomas Mueller, Director of Product Management at Bruker Nano Surfaces conducted by ...
Technology advances have steadily been implemented to improve the performance of commercial atomic force microscopes (AFMs) since the release of the first commercial model about 30 years ago. Now, the ...
STANFORD, Calif., Nov. 27, 2025 /PRNewswire/ -- nano@stanford at Stanford University will host a two-day scientific program on December 2–3, 2025 to commemorate the 40th anniversary of Atomic Force ...
SAN JOSE, Calif. — Chip-equipment provider Veeco Instruments Inc. (Woodbury, N.Y.) has signed a joint development program in the atomic force microscopy (AFM) market with France's CEA Leti and ...
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